Women break barriers in engineering and computer science at some top colleges
September 16, 2016 | The Washington Post
Women are making major gains in enrollment in engineering and computer science at some of the nation’s most prominent colleges and universities, including Dartmouth.
Attracting More Women To Study STEM In A World Full Of Geek Dude Stereotypes
July 27, 2016 | Forbes
Joseph Helble, dean of engineering at Dartmouth, believes their overall approach to teaching engineering is what’s attracting women to their program.
Dartmouth Creates History By Graduating More Female Engineers Than Male Ones
July 6, 2016 | GoodCall
Dartmouth is accustomed to making history... Fully understanding the significance of this achievement may require some background information.
Women outnumber men in a graduating class of engineers—for the first time ever
July 1, 2016 | USA Today
This year, Dartmouth made history by being the first national research university to award more undergraduate degrees in engineering to women than men.
Thayer first in the country to graduate more women than men
June 24, 2016 | The Dartmouth
For the first time since the school was established in 1867, Thayer School of Engineering graduated more female than male engineers.
More than half of Dartmouth’s engineering graduates this year were women
June 23, 2016 | Quartz
This spring, Dartmouth became the first national research university to graduate more women than men from its undergraduate engineering program.
School of Graduate and Advanced Studies Opens July 1
June 20, 2016 | Dartmouth Now
F. Jon Kull ’88 is dean of the first new school Dartmouth has established in over a century.
Dartmouth graduated more women than men in engineering this year
June 20, 2016 | TechCrunch
Dartmouth just became the first national research university to graduate more women than men in the engineering department.
“By thinking creatively about the content, context, and delivery of engineering education, Dartmouth has achieved a milestone.”
Researchers from Dartmouth and NIST have published a new study on their method of quickly scanning large fields of view for microscopic-level details.